January 01, 2024 article Open access Defect Detection in Manufacturing: An Integrated Deep Learning Approach Journal of Computer and Communications DOI: 10.4236/jcc.2024.1210011 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 12 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Machine learning based defect detection in a low automated assembly environment 2021 Procedia CIRP article Engineering Industrial Vision Systems and Defect Detection Open access 6 citations 1 result