Texture analysis of radiation sensitive organic films: Comparative study by electron diffraction tomography and GIWAXS
BIO Web of Conferences, vol. 129, pp. 07021
Authors 9
-
Friedrich-Alexander-Universität Erlangen-Nürnberg
Affiliation as printed
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg, Erlangen, Germany
-
Friedrich-Alexander-Universität Erlangen-Nürnberg
Affiliation as printed
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg, Erlangen, Germany
-
Friedrich-Alexander-Universität Erlangen-Nürnberg
Affiliation as printed
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg, Erlangen, Germany
-
Forschungszentrum Jülich · RWTH Aachen University
Affiliation as printed
Institute for a Sustainable Hydrogen Economy (INW), Forschungszentrum Jülich GmbH, Jülich, Germany
Institute of Physical Chemistry, RWTH Aachen University, Aachen, Germany
-
Friedrich-Alexander-Universität Erlangen-Nürnberg
Affiliation as printed
Institute Materials for Electronics and Energy Technology (i-MEET), FAU Erlangen-Nürnberg, Erlangen, Germany
-
Friedrich-Alexander-Universität Erlangen-Nürnberg
Affiliation as printed
Institute Materials for Electronics and Energy Technology (i-MEET), FAU Erlangen-Nürnberg, Erlangen, Germany
-
Forschungszentrum Jülich · RWTH Aachen University
Affiliation as printed
Institute for a Sustainable Hydrogen Economy (INW), Forschungszentrum Jülich GmbH, Jülich, Germany
Institute of Physical Chemistry, RWTH Aachen University, Aachen, Germany
-
Friedrich-Alexander-Universität Erlangen-Nürnberg
Affiliation as printed
Institute for Crystallography and Structural Physics (ICSP), FAU Erlangen-Nürnberg, Erlangen, Germany
-
Friedrich-Alexander-Universität Erlangen-Nürnberg
Affiliation as printed
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg, Erlangen, Germany
Cited by 0 stored of 0
No patents citing this paper on Lens.org (checked 2026-10-06).