July 11, 2024 article Open access Advancements in point cloud-based 3D defect classification and segmentation for industrial systems: A comprehensive survey Information Fusion DOI: 10.1016/j.inffus.2024.102575 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 59 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Automated surface defect detection using line scanner data and 3D model data 2026 Procedia CIRP article Engineering Industrial Vision Systems and Defect Detection Open access 0 citations 1 result References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access 3D-MPA: Multi-Proposal Aggregation for 3D Semantic Instance Segmentation 2020 IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings conference-paper Engineering 3D Shape Modeling and Analysis Open access cited by 4 patents 237 citations 1 result