A concept for a large-scale non-contact strain measurement system using nanostructures

SPIE Future Sensing Technologies, pp. 39

Abstract

The monitoring of mechanical strain is essential in developing new materials, designing mechanical components and structural health monitoring. In applications where contactless measurement is required, a novel method is needed to allow for absolute and long-term measurements. We discuss a measuring principle based on diffractive nanostructures featuring these advantages. For the measurement, periodic nanostructures are applied to a component, illuminated with a defined light source and the resulting color impression is monitored. The relationship between the stretched geometry of the nanostructure and diffraction spectra allows to quantify the component’s strain. We present a guideline for the design of industrial applicable and sensitivity-optimized nanostructures and discuss the advantages in different application scenarios.

Authors 3

1. Andreas Ulm Aachen Fraunhofer-Institut Für Produktionstechnologie IPT

   Fraunhofer Institute for Production Technology IPT

   Affiliation as printed

   Fraunhofer-Institut für Produktionstechnologie IPT (Germany)

2. Niels König
3. Robert Heinrich Schmitt Aachen Fraunhofer-Institut Für Produktionstechnologie IPT

   RWTH Aachen University · Fraunhofer Institute for Production Technology IPT

   Affiliation as printed

   Fraunhofer-Institut für Produktionstechnologie IPT (Germany)

   WZL der RWTH Aachen Univ. (Germany)