January 01, 2024 article Class Imbalance Wafer Defect Pattern Recognition Based on Shared-Database Decentralized Federated Learning Framework IEEE Transactions on Instrumentation and Measurement DOI: 10.1109/tim.2024.3395316 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 19 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access System Requirements for Decentralised Collaborative Machine Learning in Industry 4.0 2025 IEEE/ACM International Conference on Big Data Computing, Applications and Technologies (BDCAT) conference-paper Engineering Digital Transformation in Industry Open access 0 citations 1 result References 0