Supporting data for the article "Charge-Induced Artifacts in Nonlocal Spin-Transport Measurements: How to Prevent Spurious Voltage Signals"
Zenodo (CERN European Organization for Nuclear Research)
Abstract
Supporting data for the article "Charge-Induced Artifacts in Nonlocal Spin-Transport Measurements: How to Prevent Spurious Voltage Signals"\n\nIf the design files are used to reproduce the current source, we ask to cite the peer-reviewed publication of our work in any publication in which the adjustable virtual ground feature is used for measurements.\n\nWe provide the following data and design files:\n\n1.) Data used to create each figure both in the main manuscript and the supplementary material in the zip-folder "Data presented in figures".\nThe data is provided in two formats:\nI.) Raw data in freely accessible file formats such as .dat, .txt, or .csv.\nII.) Graphically processed data (figures as shown in the publication) in the proprietary file format .opju. Used program: OriginPro 2019\n\n2.) LTspice models in the zip-folder "LTspice models". The simulations were conducted with LTspice version XVII(x64).\n\n3.) Altium Designer files of the current source in the zip-folder "Altium Designer files".\n\n4.) Gerber X2 and NC drill files (dimensions in millimeters) for the manufacturing of the PCB that is used in our project in the zip-folder "Fabrication files". See the readme file in the directory for more information on the fabrication process.\n\n5.) A bill of materials.
Authors 5
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Affiliation as printed
2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany
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Affiliation as printed
2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany
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Affiliation as printed
2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany
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Affiliation as printed
2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany
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Affiliation as printed
2nd Institute of Physics and JARA-FIT, RWTH Aachen University, 52074 Aachen, Germany
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