Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy
Abstract
In this work, we explore the potential of self-supervised learning with Generative Adversarial Networks (GANs) for electron microscopy datasets. We show how self-supervised pretraining facilitates efficient fine-tuning for a spectrum of downstream tasks, including semantic segmentation, denoising, noise \& background removal, and super-resolution. Experimentation with varying model complexities and receptive field sizes reveals the remarkable phenomenon that fine-tuned models of lower complexity consistently outperform more complex models with random weight initialization. We demonstrate the versatility of self-supervised pretraining across various downstream tasks in the context of electron microscopy, allowing faster convergence and better performance. We conclude that self-supervised pretraining serves as a powerful catalyst, being especially advantageous when limited annotated data are available and efficient scaling of computational cost is important.
Authors 3
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Affiliation as printed
Forschungszentrum Jülich GmbH , Jülich , IAS- 9 , Germany
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Affiliation as printed
Forschungszentrum Jülich GmbH , Jülich , IAS- 9 , Germany
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Stefan Sandfeld Aachen
RWTH Aachen University · Forschungszentrum Jülich
Affiliation as printed
Forschungszentrum Jülich GmbH , Jülich , IAS- 9 , Germany
RWTH Aachen University , Aachen , Germany
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