January 29, 2024 article Open access Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves). Micron DOI: 10.1016/j.micron.2024.103594 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 25 References 3 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access LiberTEM: Software platform for scalable multidimensional data processing in transmission electron microscopy 2020 The Journal of Open Source Software article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 54 citations Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM 2021 Nano Letters article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 37 citations 4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection 2021 Ultramicroscopy article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications 21 citations 3 results