January 01, 2024 article Open access Enhancing spatial resolution in MÖNCH for electron microscopy via deep learning Journal of Instrumentation DOI: 10.1088/1748-0221/19/01/c01020 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 3 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Sub-pixel electron detection using a convolutional neural network 2020 Ultramicroscopy article Physics and Astronomy Particle Detector Development and Performance Open access cited by 3 patents 30 citations 1 result