A Novel 3D High Resolution Imaging Method Using Correlative X-Ray and Electron Microscopy to Study Nd:YAG Laser Induced Defects in Intraocular Lenses
Authors 5
-
Andreas F.M. Borkenstein corresponding
Affiliation as printed
Borkenstein & Borkenstein (Private Practice)
-
Adrian Mikitisin Aachen
Affiliation as printed
RWTH Aachen University
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
-
Alexander Schwedt Aachen
Universitätsklinikum Aachen · RWTH Aachen University
Affiliation as printed
RWTH Aachen University - Electron Microscopy Facility
RWTH Aachen University Hospital - Electron Microscopy Facility
-
Affiliation as printed
Borkenstein & Borkenstein (Private Practice)
-
Joachim Mayer Aachen
Universitätsklinikum Aachen · RWTH Aachen University
Affiliation as printed
RWTH Aachen University - Electron Microscopy Facility
RWTH Aachen University Hospital - Electron Microscopy Facility
Cited by 0 stored of 0
No patents citing this paper on Lens.org (checked 2026-10-06).