Broadband uniform-efficiency OAM detector

Frontiers in Optics + Laser Science (FiO, LS), pp. JTu5A.15

Abstract

We propose an OAM measurement technique with uniform efficiency for any general wideband state. We demonstrate our technique for up to 100-dimensional state with 99.85% accuracy at high light and single photon levels.

Authors 3

1. Suman Karan corresponding

   Indian Institute of Technology Kanpur

   Affiliation as printed

   Department of Physics, Indian Institute of Technology Kanpur, Kanpur, UP 208016, India

2. MP Van Exter corresponding Aachen Huygens-Kamerlingh Onnes Laboratory

   Leiden University

   Affiliation as printed

   Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O.Box 9504,2300 RA Leiden, The Netherlands

3. Anand K. Jha corresponding

   Indian Institute of Technology Kanpur

   Affiliation as printed

   Department of Physics, Indian Institute of Technology Kanpur, Kanpur, UP 208016, India