January 01, 2023 article A Pixel-Level Segmentation Convolutional Neural Network Based on Global and Local Feature Fusion for Surface Defect Detection IEEE Transactions on Instrumentation and Measurement DOI: 10.1109/tim.2023.3323004 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 28 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access State Estimation for Medium- and Low-Voltage Distribution Systems Considering Measurement Characteristics and Grounded Slack Bus 2022 IEEE Transactions on Instrumentation and Measurement article Engineering Power System Optimization and Stability 121 citations 1 result