Insights into the Si─H Bonding Configuration at the Amorphous/Crystalline Silicon Interface of Silicon Heterojunction Solar Cells by Raman and FTIR Spectroscopy
Advanced Materials, vol. 35, pp. e2306351
Abstract
In silicon heterojunction solar cell technology, thin layers of hydrogenated amorphous silicon (a-Si:H) are applied as passivating contacts to the crystalline silicon (c-Si) wafer. Thus, the properties of the a-Si:H is crucial for the performance of the solar cells. One important property of a-Si:H is its microstructure which can be characterized by the microstructure parameter R based on Si─H bond stretching vibrations. A common method to determine R is Fourier transform infrared (FTIR) absorption measurement which, however, is difficult to perform on solar cells for various reasons like the use of textured Si wafers and the presence of conducting oxide contact layers. Here, it is demonstrated that Raman spectroscopy is suitable to determine the microstructure of bulk a-Si:H layers of 10 nm or less on textured c-Si underneath indium tin oxide as conducting oxide. A detailed comparison of FTIR and Raman spectra is performed and significant differences in the microstructure parameter are obtained by both methods with decreasing a-Si:H film thickness.
Authors 8
-
RWTH Aachen University · Forschungszentrum Jülich · Jülich Aachen Research Alliance
Affiliation as printed
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
Jülich Aachen Research Alliance (JARA‐Energy) and Faculty of Electrical Engineering and Information Technology RWTH Aachen University Schinkelstr. 2 52062 Aachen Germany
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
Jülich Aachen Research Alliance (JARA‐Energy) and Faculty of Electrical Engineering and Information Technology RWTH Aachen University Schinkelstr. 2 52062 Aachen Germany
-
Affiliation as printed
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
-
Affiliation as printed
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
-
Affiliation as printed
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
Wolfhard Beyer passed away in the course of the publication process
-
Affiliation as printed
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
-
Affiliation as printed
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
-
Affiliation as printed
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
-
Uwe Rau Aachen
RWTH Aachen University · Forschungszentrum Jülich · Jülich Aachen Research Alliance
Affiliation as printed
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
Jülich Aachen Research Alliance (JARA‐Energy) and Faculty of Electrical Engineering and Information Technology RWTH Aachen University Schinkelstr. 2 52062 Aachen Germany
IEK‐5 Photovoltaik Forschungszentrum Jülich GmbH Wilhelm‐Johnen Straße 52425 Jülich Germany
Jülich Aachen Research Alliance (JARA‐Energy) and Faculty of Electrical Engineering and Information Technology RWTH Aachen University Schinkelstr. 2 52062 Aachen Germany
Cited by 29 stored of 29
No patents citing this paper on Lens.org (checked 2026-10-06).