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June 21, 2023 conference-paper

A CUSUM-based condition monitoring algorithm for power electronics based on SOM-MQE feature extraction method

IEEE Transportation Electrification Conference & Expo (ITEC)

DOI: 10.1109/itec55900.2023.10186893 OpenAlex

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Diagnosing Power Module Degradation with High-Resolution, Data-Driven Methods
2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies

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