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Pixel Super‐Resolution Interference Pattern Sensing Via the Aliasing Effect for Laser Frequency Metrology

Laser & Photonics Review, vol. 17

Abstract

Abstract The superposition of several optical beams with large mutual angles results in sub‐micrometer periodic patterns with a complex intensity, phase, and polarization structure. For high‐resolution imaging thereof, one often employs optical super‐resolution methods such as scanning nano‐particle imaging. Here, it is reported that by using a conventional arrayed image sensor in combination with 2D Fourier analysis, the periodicities of light fields much smaller than the pixel size can be resolved in a simple and compact setup, with a resolution far beyond the Nyquist limit set by the pixel size. The ability to resolve periodicities with spatial frequencies of ≈3 µm−1, 15 times higher than the pixel sampling frequency of 0.188 µm−1, is demonstrated. This is possible by analyzing high‐quality Fourier aliases in the first Brillouin zone. In order to obtain the absolute spatial frequencies of the interference patterns, simple rotation of the image sensor is sufficient, which modulates the effective pixel size and allows determination of the original Brillouin zone. Based on this method, wavelength sensing with a resolving power beyond 100,000 without any special equipment is demonstrated.

Authors 4

  1. Lipeng Wan Aachen

    Leiden University · Nanchang University · Zhejiang University

    Affiliation as printed

    Leiden Institute of Physics Leiden University Leiden CA 2333 The Netherlands

    School of Physics and Material Science Nanchang University Nanchang 330031 China

    Zhejiang Province Key Laboratory of Quantum Technology and Devices School of Physics Zhejiang University Hangzhou 310027 China

    Leiden Institute of Physics, Leiden University, Leiden, CA, 2333 The Netherlands

    School of Physics and Material Science, Nanchang University, Nanchang, 330031 China

    Zhejiang Province Key Laboratory of Quantum Technology and Devices, School of Physics, Zhejiang University, Hangzhou, 310027 China

  2. Nanchang University

    Affiliation as printed

    School of Physics and Material Science Nanchang University Nanchang 330031 China

    School of Physics and Material Science, Nanchang University, Nanchang, 330031 China

  3. Zhejiang University

    Affiliation as printed

    Zhejiang Province Key Laboratory of Quantum Technology and Devices School of Physics Zhejiang University Hangzhou 310027 China

    Zhejiang Province Key Laboratory of Quantum Technology and Devices, School of Physics, Zhejiang University, Hangzhou, 310027 China

  4. W. Löffler corresponding Aachen

    Leiden University

    Affiliation as printed

    Leiden Institute of Physics Leiden University Leiden CA 2333 The Netherlands

    Email: [email protected]

    Leiden Institute of Physics, Leiden University, Leiden, CA, 2333 The Netherlands

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References 28