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June 23, 2023 article

A Reduced-Order Decoupling Method Applied to Efficient Junction Temperature Simulation Model in Multichip Devices

IEEE Journal of Emerging and Selected Topics in Power Electronics

DOI: 10.1109/jestpe.2023.3288125 OpenAlex

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Online Junction-Temperature Extraction Method for SiC MOSFETs Utilizing Turn-on Delay
2021 IEEE Workshop on Wide Bandgap Power Devices and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies cited by 1 patent

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