May 28, 2023 article Open access Measuring Spatially‐Resolved Potential Drops at Semiconductor Hetero‐Interfaces Using 4D‐STEM Small Methods DOI: 10.1002/smtd.202300453 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 14 References 3 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM 2021 Nano Letters article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 37 citations Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy 2020 Scientific Reports article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 27 citations Contribution of multiple plasmon scattering in low-angle electron diffraction investigated by energy-filtered atomically resolved 4D-STEM 2022 Applied Physics Letters article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 13 citations 3 results