May 18, 2023 article Open access A novel approach to using artificial intelligence in coordinate metrology including nano scale Measurement DOI: 10.1016/j.measurement.2023.113051 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 35 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Metrologically interpretable feature extraction for industrial machine vision using generative deep learning 2022 CIRP Annals article Engineering Industrial Vision Systems and Defect Detection 20 citations 1 result