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January 01, 2023 article Open access

Visualization for Explanation of Deep Learning-Based Defect Detection Model Using Class Activation Map

Computers, materials & continua/Computers, materials & continua (Print)

DOI: 10.32604/cmc.2023.038362 Full text (OA) OpenAlex

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An Annotation-Efficient Parallel Processing Framework for Robust Defect Detection in TFT-LCD Manufacturing
2026 Results in Engineering article Engineering Industrial Vision Systems and Defect Detection Open access

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