November 18, 2022 article Challenges and opportunities of deep learning-based process fault detection and diagnosis: a review Neural Computing and Applications DOI: 10.1007/s00521-022-08017-3 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 188 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A Data-Driven Framework for Anomaly Detection in Industrial Systems Using Log Data 2025 Proceedings of the Annual Conference of the IEEE Industrial Electronics Society conference-paper Computer Science Software System Performance and Reliability 0 citations 1 result References 0