Conformance Checking for Trace Fragments Using Infix and Postfix Alignments
Lecture notes in computer science, pp. 299–310
Authors 4
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Fraunhofer Institute for Applied Information Technology · RWTH Aachen University
Affiliation as printed
Fraunhofer Institute for Applied Information Technology FIT, Sankt Augustin, Germany
RWTH Aachen University, Aachen, Germany
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Fraunhofer Institute for Applied Information Technology
Affiliation as printed
Fraunhofer Institute for Applied Information Technology FIT, Sankt Augustin, Germany
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Sebastiaan J. van Zelst Aachen
Fraunhofer Institute for Applied Information Technology · RWTH Aachen University
Affiliation as printed
Fraunhofer Institute for Applied Information Technology FIT, Sankt Augustin, Germany
RWTH Aachen University, Aachen, Germany
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Wil M. P. van der Aalst Aachen
Fraunhofer Institute for Applied Information Technology · RWTH Aachen University
Affiliation as printed
Fraunhofer Institute for Applied Information Technology FIT, Sankt Augustin, Germany
RWTH Aachen University, Aachen, Germany
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