Determining the efficiency of a cryogenic far-infrared diffraction grating spectrometer used as a post-dispersing module for a high-resolution spectrometer
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy XI, pp. 149
Abstract
Recent advances in far-infrared detector technology have led to increases in raw sensitivity of more than an order of magnitude over previous state-of-the-art detectors. With such sensitivity, photon noise becomes the dominant noise component, even when using cryogenically cooled optics, unless a method of restricting the spectral bandpass is employed. The leading instrument concept features reflecting grating spectrometers to post-disperse the light that has been modulated by a polarizing Fourier transform spectrometer (FTS) onto a detector array, thereby reducing the photon noise on each detector. This paper describes the development of a cryogenic (4 K) reflection grating spectrometer which operates over the wavelength range from 285 µm–500 µm and was used to post-disperse the output from a room-temperature polarizing FTS. Measurements of the grating resolving power and diffraction efficiency are presented as a function of both wavelength and polarization to characterize the instrument performance
Authors 7
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Affiliation as printed
Blue Sky Spectroscopy Inc. (Canada)
Univ. of Lethbridge (Canada)
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Affiliation as printed
Univ. of Lethbridge (Canada)
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Affiliation as printed
Univ. of Lethbridge (Canada)
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Space Research Organisation Netherlands
Affiliation as printed
SRON Netherlands Institute for Space Research (Netherlands)
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Affiliation as printed
Blue Sky Spectroscopy Inc. (Canada)
Univ. of Lethbridge (Canada)
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Affiliation as printed
Univ. of Groningen (Netherlands)
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Affiliation as printed
Cardiff Univ. (United Kingdom)
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