January 25, 2022 article Open access Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks Journal of Intelligent Manufacturing DOI: 10.1007/s10845-021-01906-9 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 71 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Sheet metal localization using deep learning and synthetic data 2025 Journal of Intelligent Manufacturing article Engineering Industrial Vision Systems and Defect Detection Open access 3 citations 1 result References 0