December 01, 2021 article Open access Terahertz scattering-type near-field microscopy quantitatively determines the conductivity and charge carrier density of optically doped and impurity-doped silicon APL Photonics DOI: 10.1063/5.0070608 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 13 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A novel scattering-type THz microprobe with integrated source and detector for contact-free, high-speed surface imaging at sub-μm-resolution 2023 International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) conference-paper Engineering Terahertz technology and applications 1 citations 1 result References 0