Signal Processing for Advanced Materials [From the Guest Editors]

IEEE Signal Processing Magazine, vol. 39, pp. 12–15

Abstract

The development of new materials has been a hallmark of technological advancement since at least the Bronze Age, when copper and tin were alloyed to create tools that had properties favorable to those made from stone. For thousands of years, until the development of microscope imaging, new materials continued to be developed “blindly,” without any understanding of the effects of the structure at the micro- or nanoscale on the observable properties of a material. With the advent of sensing modalities, such as electron microscopy and X-ray tomography, huge amounts of microstructural data of many different classes of materials have become available.

Authors 5

1. Mary L. Comer

   Purdue University West Lafayette

   Affiliation as printed

   Purdue University, West Lafayette, Indiana, USA

2. Jeff P. Simmons

   United States Air Force Research Laboratory · U.S. Air Force Research Laboratory Materials and Manufacturing Directorate

   Affiliation as printed

   Materials and Manufacturing Directorate of the Air Force Research Laboratory (AFRL), Wright-Patterson, Ohio, USA

3. Stephen R. Niezgoda

   The Ohio State University

   Affiliation as printed

   The Ohio State University, Columbus, Ohio, USA

4. Charles A. Bouman

   Princeton University

   Affiliation as printed

   Princeton University

5. Benjamin Berkels Aachen

   RWTH Aachen University

   Affiliation as printed

   Rheinisch-Westfälische Technische Hochschule