October 07, 2021 article Open access A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode Journal of Synchrotron Radiation DOI: 10.1107/s1600577521009401 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 4 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Digging deeper: Buried layers and interfaces studied by modified total electron yield and soft x-ray absorption spectroscopy 2022 Applied Physics Letters article Materials Science Electron and X-Ray Spectroscopy Techniques Open access 2 citations 1 result References 0