A

Retarding Ostwald ripening through Gibbs adsorption and interfacial complexions leads to high-performance SnTe thermoelectrics

Energy & Environmental Science, vol. 14, pp. 5469–5479

Abstract

Interfacial complexions formed by Gibbs adsorption of Ag retard the Ostwald ripening of CdTe precipitates in SnTe, minimizing the thermal conductivity. Combined with the band convergence, a high and stable zT of 1.5 is obtained in SnAg 0.05 Te-6%CdSe.

Authors 15

  1. Taiyuan University of Technology

    Affiliation as printed

    College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China

  2. Xi'an Jiaotong University · RWTH Aachen University

    Affiliation as printed

    Center for Alloy Innovation and Design, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China

    Institute of Physics IA, RWTH Aachen University, 52056 Aachen, Germany

    Center for Alloy Innovation and Design, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China

  3. Taiyuan University of Technology

    Affiliation as printed

    College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China

  4. Taiyuan University of Technology

    Affiliation as printed

    College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China

  5. Taiyuan University of Technology

    Affiliation as printed

    College of Physics and Optoelectronics, Taiyuan University of Technology, Taiyuan 030024, China

  6. Hefei University of Technology

    Affiliation as printed

    School of Materials Science and Engineering, Hefei University of Technology, Hefei 230009, China

  7. Chinese Academy of Sciences · Institute of Coal Chemistry · State Key Laboratory of Coal Conversion

    Affiliation as printed

    Analytical Instrumentation Center, State Key Laboratory of Coal Conversion, Institute of Coal Chemistry, Chinese Academy of Sciences, Taiyuan 030001, China

  8. Xi'an Jiaotong University

    Affiliation as printed

    School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China

    School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China

  9. Xi'an Jiaotong University

    Affiliation as printed

    School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China

    School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China

  10. RWTH Aachen University

    Affiliation as printed

    Institute of Physics IA, RWTH Aachen University, 52056 Aachen, Germany

  11. RWTH Aachen University

    Affiliation as printed

    Institute of Physics IA, RWTH Aachen University, 52056 Aachen, Germany

  12. Shaoping Chen corresponding

    Taiyuan University of Technology

    Affiliation as printed

    College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China

  13. Wenxian Wang corresponding

    Taiyuan University of Technology

    Affiliation as printed

    College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China

  14. Northwestern University

    Affiliation as printed

    Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA

  15. Yuan Yu corresponding Aachen Institute of Physics IA

    RWTH Aachen University

    Affiliation as printed

    Institute of Physics IA, RWTH Aachen University, 52056 Aachen, Germany

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References 83