Retarding Ostwald ripening through Gibbs adsorption and interfacial complexions leads to high-performance SnTe thermoelectrics
Energy & Environmental Science, vol. 14, pp. 5469–5479
Abstract
Interfacial complexions formed by Gibbs adsorption of Ag retard the Ostwald ripening of CdTe precipitates in SnTe, minimizing the thermal conductivity. Combined with the band convergence, a high and stable zT of 1.5 is obtained in SnAg 0.05 Te-6%CdSe.
Authors 15
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Taiyuan University of Technology
Affiliation as printed
College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China
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Xi'an Jiaotong University · RWTH Aachen University
Affiliation as printed
Center for Alloy Innovation and Design, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China
Institute of Physics IA, RWTH Aachen University, 52056 Aachen, Germany
Center for Alloy Innovation and Design, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
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Taiyuan University of Technology
Affiliation as printed
College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China
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Taiyuan University of Technology
Affiliation as printed
College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China
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Taiyuan University of Technology
Affiliation as printed
College of Physics and Optoelectronics, Taiyuan University of Technology, Taiyuan 030024, China
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Hefei University of Technology
Affiliation as printed
School of Materials Science and Engineering, Hefei University of Technology, Hefei 230009, China
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Chinese Academy of Sciences · Institute of Coal Chemistry · State Key Laboratory of Coal Conversion
Affiliation as printed
Analytical Instrumentation Center, State Key Laboratory of Coal Conversion, Institute of Coal Chemistry, Chinese Academy of Sciences, Taiyuan 030001, China
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Affiliation as printed
School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China
School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
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Affiliation as printed
School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China
School of Microelectronics, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
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Affiliation as printed
Institute of Physics IA, RWTH Aachen University, 52056 Aachen, Germany
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Affiliation as printed
Institute of Physics IA, RWTH Aachen University, 52056 Aachen, Germany
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Shaoping Chen corresponding
Taiyuan University of Technology
Affiliation as printed
College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China
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Wenxian Wang corresponding
Taiyuan University of Technology
Affiliation as printed
College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China
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Affiliation as printed
Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA
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Affiliation as printed
Institute of Physics IA, RWTH Aachen University, 52056 Aachen, Germany
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