July 30, 2021 article Open access Accurately measuring ice thickness quickly and quantitatively on a screening TEM Microscopy and Microanalysis DOI: 10.1017/s1431927621004372 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 3 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Measuring cryo-TEM sample thickness using reflected light microscopy and machine learning 2023 Journal of Structural Biology article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 11 citations Selecting optimal support grids for super-resolution cryogenic correlated light and electron microscopy 2022 bioRxiv (Cold Spring Harbor Laboratory) preprint Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 1 citations 2 results References 0