Experimental realization of a π /2 vortex mode converter for electrons using a spherical aberration corrector
Ultramicroscopy, vol. 229, pp. 113340
Abstract
In light optics, beams with orbital angular momentum (OAM) can be produced by employing a properly-tuned two-cylinder-lens arrangement, also called π/2 mode converter. It is not possible to convey this concept directly to the beam in an electron microscope due to the non-existence of cylinder lenses in commercial transmission electron microscopes (TEMs). A viable work-around are readily-available electron optical elements in the form of quadrupole lenses. In a proof-of-principle experiment in 2012, it has been shown that a single quadrupole in combination with a Hilbert phase-plate produces a spatially-confined, transient vortex mode. Here, an analogue to an optical π/2 mode converter is realized by repurposing a CEOS DCOR probe corrector in an aberration corrected TEM in a way that it resembles a dual cylinder lens using two quadrupoles. In order to verify the presence of OAM in the output beam, a fork dislocation grating is used as an OAM analyser. The possibility to use magnetic quadrupole fields instead of, e.g., prefabricated fork dislocation gratings to produce electron beams carrying OAM enhances the beam brightness by almost an order of magnitude and delivers switchable high-mode purity vortex beams without unwanted side-bands.
Authors 9
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Thomas Schachinger corresponding
Affiliation as printed
Institute of Solid State Physics, TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria; University Service Centre for Transmission Electron Microscopy (USTEM), TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria. Electronic address: thomas.schachinger@tuwien.ac.at
Institute of Solid State Physics, TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
University Service Centre for Transmission Electron Microscopy (USTEM), TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
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Corrected Electron Optical Systems (Germany)
Affiliation as printed
CEOS Corrected Electron Optical Systems GmbH, Englerstraße 28, 69126 Heidelberg, Germany
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Peng‐Han Lu Aachen
Forschungszentrum Jülich · Ernst Ruska Centre · RWTH Aachen University
Affiliation as printed
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany; RWTH Aachen University, Ahornstraße 55, 52074 Aachen, Germany
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
RWTH Aachen University, Ahornstraße 55, 52074 Aachen, Germany
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Affiliation as printed
University Service Centre for Transmission Electron Microscopy (USTEM), TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
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Karlsruhe Institute of Technology
Affiliation as printed
Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT), Engesserstraße 7, 76131 Karlsruhe, Germany
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Karlsruhe Institute of Technology
Affiliation as printed
Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT), Engesserstraße 7, 76131 Karlsruhe, Germany
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Karlsruhe Institute of Technology
Affiliation as printed
Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT), Engesserstraße 7, 76131 Karlsruhe, Germany
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Forschungszentrum Jülich · Ernst Ruska Centre
Affiliation as printed
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
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Affiliation as printed
Institute of Solid State Physics, TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria; University Service Centre for Transmission Electron Microscopy (USTEM), TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
Institute of Solid State Physics, TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
University Service Centre for Transmission Electron Microscopy (USTEM), TU Wien, Wiedner Hauptstraße 8-10, 1040 Wien, Austria
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