May 12, 2021 article Deep-Learning-Enabled Automatic Optical Inspection for Module-Level Defects in LCD IEEE Internet of Things Journal DOI: 10.1109/jiot.2021.3079440 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 41 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access An Annotation-Efficient Parallel Processing Frameworkfor Robust Defect Detection in TFT-LCD Manufacturing 2026 SSRN Electronic Journal preprint Engineering Industrial Vision Systems and Defect Detection Open access 0 citations Automatic Labeling in Image Segmentation and Classification for TFT-LCD Manufacturing 2022 IEEE International Conference on Mechatronics and Automation (ICMA) conference-paper Engineering Industrial Vision Systems and Defect Detection 1 citations 2 results References 0