May 06, 2021 article Open access Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy Data Microscopy and Microanalysis DOI: 10.1017/s1431927621000386 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 75 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Enhancing Semantic Segmentation in High-Resolution TEM Images: A Comparative Study of Batch Normalization and Instance Normalization 2024 Microscopy and Microanalysis article Computer Science Advanced Neural Network Applications Open access 10 citations Characterizing battery materials and electrodes via in situ / operando transmission electron microscopy 2022 Chemical Physics Reviews article Engineering Advancements in Battery Materials Open access 33 citations 2 results References 0