November 16, 2020 article Open access Improving the reliability of conductive atomic force microscopy-based electrical contact resistance measurements Nano Express DOI: 10.1088/2632-959x/abcae0 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 15 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Current-Limited Conductive Atomic Force Microscopy 2023 ACS Applied Materials & Interfaces article Physics and Astronomy Force Microscopy Techniques and Applications 9 citations 1 result References 0