October 11, 2020 conference-paper Investigation of Dynamic Temperature-Sensitive Electrical Parameters for Medium-Voltage Low-Current Silicon Carbide and Silicon Devices IEEE Energy Conversion Congress and Exposition (ECCE) DOI: 10.1109/ecce44975.2020.9236121 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 7 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Sensitivity Analysis Method of Temperature-Dependent Parameters During Turn-on Process of SiC Power MOSFETs 2022 IEEE Annual Southern Power Electronics Conference conference-paper Engineering Silicon Carbide Semiconductor Technologies 5 citations 1 result References 0