November 06, 2020 article Open access Reliability of Power Electronic Systems for EV/HEV Applications Proceedings of the IEEE DOI: 10.1109/jproc.2020.3031041 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 4 stored of 241 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Utilizing Electroluminescence of Silicon IGBTs for Junction Temperature Sensing 2023 International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) conference-paper Engineering Silicon Carbide Semiconductor Technologies 2 citations FEPPCON XI – Part II: Reliability of Power Electronic Systems 2023 IEEE Power Electronics Magazine article Engineering Reliability and Maintenance Optimization 2 citations Intelligent Monitoring and Maintenance Technology for Next-Generation Power Electronic Systems 2021 IEEE Journal of Emerging and Selected Topics in Power Electronics article Engineering Reliability and Maintenance Optimization cited by 3 patents 21 citations Junction-Temperature Sensing of Paralleled SiC MOSFETs Utilizing Temperature Sensitive Optical Parameters 2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access 11 citations 4 results References 0