July 29, 2020 article Open access Understanding important features of deep learning models for segmentation of high-resolution transmission electron microscopy images npj Computational Materials DOI: 10.1038/s41524-020-00363-x Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 4 stored of 214 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Enhancing Semantic Segmentation in High-Resolution TEM Images: A Comparative Study of Batch Normalization and Instance Normalization 2024 Microscopy and Microanalysis article Computer Science Advanced Neural Network Applications Open access 10 citations Combining unsupervised and supervised learning in microscopy enables defect analysis of a full 4H-SiC wafer 2024 MRS Communications article Engineering Industrial Vision Systems and Defect Detection Open access cited by 1 patent 8 citations Screening of Coatings for an All-Solid-State Battery using In Situ Transmission Electron Microscopy 2023 Journal of Visualized Experiments article Engineering Advanced Battery Materials and Technologies 0 citations Screening of Coatings for an All-Solid-State Battery using In Situ Transmission Electron Microscopy 2023 Journal of Visualized Experiments article Engineering Advanced Battery Materials and Technologies Open access 0 citations 4 results References 0