Platinum substrate for surface plasmon microscopy at small angles
Optics Letters, vol. 45, pp. 3292
Abstract
Platinum is reported as the main component of the substrate in surface plasmon microscopy of the metal-dielectric interface for small-angle measurements. In the absence of a narrow dip in the angular spectrum of platinum, the refractive index of the dielectric medium or the thickness of a deposited layer is proven deducible from the observed sharp peak, close to the critical angle. The sensitivities of refractive index and thickness measurements using platinum are compared with that of a gold surface plasmon resonance chip. Furthermore, the thickness of a structured layer of (3-Aminopropyl)triethoxysilane on the platinum substrate is measured to be 0.7 nm, demonstrating the high sensitivity of the technique.
Authors 5
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Forschungszentrum Jülich · RWTH Aachen University
Affiliation as printed
Forschungszentrum Jülich GmbH, Institute of Biological Information Processing, Bioelectronics (IBI-3), Jülich, Germany
RWTH Aachen University, I. Institute of Physics (IA), Aachen, Germany
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Nikolaus Radja Wolf corresponding
Affiliation as printed
Forschungszentrum Jülich GmbH, Institute of Biological Information Processing, Bioelectronics (IBI-3), Jülich, Germany
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Xiaobo Yuan corresponding
Affiliation as printed
Forschungszentrum Jülich GmbH, Institute of Biological Information Processing, Bioelectronics (IBI-3), Jülich, Germany
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Roger Wördenweber corresponding
Affiliation as printed
Forschungszentrum Jülich GmbH, Institute of Biological Information Processing, Bioelectronics (IBI-3), Jülich, Germany
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Forschungszentrum Jülich · RWTH Aachen University
Affiliation as printed
Forschungszentrum Jülich GmbH, Institute of Biological Information Processing, Bioelectronics (IBI-3), Jülich, Germany
RWTH Aachen University, I. Institute of Physics (IA), Aachen, Germany
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