March 16, 2020 article Open access Accurate tip characterization in critical dimension atomic force microscopy Measurement Science and Technology DOI: 10.1088/1361-6501/ab7fd2 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 36 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access AFM‐Based Hamaker Constant Determination with Blind Tip Reconstruction 2022 Advanced Materials Technologies article Physics and Astronomy Force Microscopy Techniques and Applications Open access 23 citations 1 result References 0