June 01, 2020 conference-paper Open access Total Deep Variation for Linear Inverse Problems IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings DOI: 10.1109/cvpr42600.2020.00757 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 80 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Benchmarking learned algorithms for computed tomography image reconstruction tasks 2025 Applied Mathematics for Modern Challenges article Medicine Medical Imaging Techniques and Applications Open access 5 citations Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission Electron Microscopy 2021 Lecture notes in computer science conference-paper Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications 1 citations 2 results References 0