October 30, 2019 article Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel Journal of Intelligent Manufacturing DOI: 10.1007/s10845-019-01502-y OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 57 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Automatic Labeling in Image Segmentation and Classification for TFT-LCD Manufacturing 2022 IEEE International Conference on Mechatronics and Automation (ICMA) conference-paper Engineering Industrial Vision Systems and Defect Detection 1 citations 1 result References 0