February 14, 2019 article Quantifying Uncertainty from Mass-Peak Overlaps in Atom Probe Microscopy Microscopy and Microanalysis DOI: 10.1017/s1431927618016276 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 50 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Structural and compositional analysis of (InGa)(AsSb)/GaAs/GaP Stranski–Krastanov quantum dots 2021 Light Science & Applications article Physics and Astronomy Semiconductor Quantum Structures and Devices Open access 21 citations Solving Peak Overlaps for Proximity Histogram Analysis of Complex Interfaces for Atom Probe Tomography Data 2021 RWTH Publications (RWTH Aachen) article Engineering Advanced Materials Characterization Techniques 5 citations Solving Peak Overlaps for Proximity Histogram Analysis of Complex Interfaces for Atom Probe Tomography Data 2020 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access 16 citations 3 results References 0