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April 01, 2018 conference-paper

Combinatorial Testing with Constraints for Negative Test Cases

IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

DOI: 10.1109/icstw.2018.00068 OpenAlex

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Cited by 1 stored of 10

Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing
2020 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) conference-paper Computer Science Software Testing and Debugging Techniques

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