May 15, 2018 article IGBT Junction Temperature Estimation via Gate Voltage Plateau Sensing IEEE Transactions on Industry Applications DOI: 10.1109/tia.2018.2836362 OpenAlex Authors 0 Author list not loaded yet. Cited by 16 stored of 108 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Utilizing Electroluminescence of Silicon IGBTs for Junction Temperature Sensing 2023 International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) conference-paper Engineering Silicon Carbide Semiconductor Technologies 2 citations Evaluating On-State Voltage and Junction Temperature Monitoring Concepts for Wide-Bandgap Semiconductor Devices 2022 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies Open access 11 citations Online Junction-Temperature Extraction Method for SiC MOSFETs Utilizing Turn-on Delay 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies cited by 1 patent 9 citations Intelligent Monitoring and Maintenance Technology for Next-Generation Power Electronic Systems 2021 IEEE Journal of Emerging and Selected Topics in Power Electronics article Engineering Reliability and Maintenance Optimization cited by 3 patents 21 citations Online Junction Temperature Monitoring of Power Semiconductor Devices Based on a Wheatstone Bridge 2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access 9 citations Junction-Temperature Sensing of Paralleled SiC MOSFETs Utilizing Temperature Sensitive Optical Parameters 2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access 11 citations Balancing the Switching Losses of Paralleled SiC MOSFETs Using a Stepwise Gate Driver 2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access 9 citations Increasing Torque Capability of AC Drives via Active Thermal Management of Inverters 2021 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies 16 citations Research on Active Thermal Control: Actual Status and Future Trends 2021 IEEE Journal of Emerging and Selected Topics in Power Electronics article Engineering Silicon Carbide Semiconductor Technologies 93 citations Reviewing Thermal-Monitoring Techniques for Smart Power Modules 2021 IEEE Journal of Emerging and Selected Topics in Power Electronics article Engineering Silicon Carbide Semiconductor Technologies cited by 1 patent 78 citations Next Generation Monitoring of SiC mosfets Via Spectral Electroluminescence Sensing 2021 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies cited by 3 patents 27 citations Active Thermal Management for Enhancing Peak-Current Capability of Three-Phase Inverters 2020 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies 16 citations Enhancing Lifetime of Power Electronic Modules via Thermal Buffers 2020 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies 9 citations Real-Time Monitoring of Thermal Response and Life-Time Varying Parameters in Power Modules 2020 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies 49 citations Semiconductor Temperature and Condition Monitoring Using Gate-Driver-Integrated Inverter Output Voltage Measurement 2020 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies 15 citations Utilizing Electroluminescence of SiC MOSFETs for Unified Junction-Temperature and Current Sensing 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) conference-paper Engineering Silicon Carbide Semiconductor Technologies 23 citations 16 results References 0