December 01, 2017 conference-paper Double pulse test based switching characterization of SiC MOSFET National Power Electronics Conference (NPEC) DOI: 10.1109/npec.2017.8310478 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 61 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Automated Gate-Profile Optimization to Maximize the Potential of Active Gate Drivers 2026 International Power Electronics Conference (IPEC) conference-paper Engineering Silicon Carbide Semiconductor Technologies 0 citations Duty-Cycle Control of Three-Phase Multi-Active-Bridge Converters 2025 IEEE Journal of Emerging and Selected Topics in Power Electronics article Engineering Advanced DC-DC Converters 3 citations 2 results References 0