January 23, 2018 article Temperature-Controlled Power Semiconductor Characterization Using Thermoelectric Coolers IEEE Transactions on Industry Applications DOI: 10.1109/tia.2018.2796574 OpenAlex Authors 0 Author list not loaded yet. Cited by 6 stored of 40 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Evaluating On-State Voltage and Junction Temperature Monitoring Concepts for Wide-Bandgap Semiconductor Devices 2022 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies Open access 11 citations Online Junction-Temperature Extraction Method for SiC MOSFETs Utilizing Turn-on Delay 2021 IEEE Workshop on Wide Bandgap Power Devices and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies cited by 1 patent 9 citations Online Junction Temperature Monitoring of Power Semiconductor Devices Based on a Wheatstone Bridge 2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access 9 citations Junction-Temperature Sensing of Paralleled SiC MOSFETs Utilizing Temperature Sensitive Optical Parameters 2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access 11 citations Next Generation Monitoring of SiC mosfets Via Spectral Electroluminescence Sensing 2021 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies cited by 3 patents 27 citations Utilizing Electroluminescence of SiC MOSFETs for Unified Junction-Temperature and Current Sensing 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) conference-paper Engineering Silicon Carbide Semiconductor Technologies 23 citations 6 results References 0