December 27, 2017 article On Effectiveness of Transfer Learning Approach for Neural Network-Based Virtual Metrology Modeling IEEE Transactions on Semiconductor Manufacturing DOI: 10.1109/tsm.2017.2787550 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 37 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Demonstrating computer vision to small‐ and medium‐sized enterprises in manufacturing: Toward overcoming costs and implementation challenges 2024 Engineering Reports article Engineering Industrial Vision Systems and Defect Detection Open access 5 citations 1 result References 0