March 01, 2017 article A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes IEEE Transactions on Semiconductor Manufacturing DOI: 10.1109/tsm.2017.2676245 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 486 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A Spatio-Temporal Ensemble Deep Learning Architecture for Real-Time Defect Detection during Laser Welding on Low Power Embedded Computing Boards 2021 Sensors article Engineering Industrial Vision Systems and Defect Detection Open access cited by 1 patent 71 citations Deep Learning and Conventional Machine Learning for Image-Based in-Situ Fault Detection During Laser Welding: A Comparative Study 2021 Preprints.org preprint Engineering Industrial Vision Systems and Defect Detection Open access 4 citations Improving Build Quality in Laser Powder Bed Fusion Using High Dynamic Range Imaging and Model-Based Reinforcement Learning 2021 IEEE Access article Engineering Additive Manufacturing Materials and Processes Open access 72 citations 3 results References 0