February 06, 2017 article Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography Microscopy and Microanalysis DOI: 10.1017/s1431927616012642 OpenAlex Authors 0 Author list not loaded yet. Cited by 5 stored of 110 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography 2024 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access 44 citations Unveiling the diffusion pathways under high-temperature oxidation of Cr2AlC MAX phase via nanoscale analysis 2024 Corrosion Science article Materials Science MXene and MAX Phase Materials Open access 12 citations Predicting yield stress in a nano-precipitate strengthened austenitic steel by integrating multi length-scale simulations and experiments 2024 Acta Materialia article Engineering Microstructure and Mechanical Properties of Steels Open access 12 citations Atom Probe Tomography 2021 Elsevier eBooks book-chapter Engineering Advanced Materials Characterization Techniques Open access 399 citations Cryo-focused ion beam preparation of perovskite based solar cells for atom probe tomography 2020 PLoS ONE article Engineering Advanced Materials Characterization Techniques Open access 41 citations 5 results References 0