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September 01, 2013 conference-paper

Automatic TFT-LCD mura detection based on image reconstruction and processing

IEEE International Conference on Consumer Electronics - Berlin (ICCE-Berlin)

DOI: 10.1109/icce-berlin.2013.6698053 OpenAlex

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Automatic Labeling in Image Segmentation and Classification for TFT-LCD Manufacturing
2022 IEEE International Conference on Mechatronics and Automation (ICMA) conference-paper Engineering Industrial Vision Systems and Defect Detection

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