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April 01, 2016 conference-paper

Analyzing Minimal Failure-Causing Schemas in Siemens Suite

IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

DOI: 10.1109/icstw.2016.33 OpenAlex

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Cited by 1 stored of 7

A Comparison Infrastructure for Fault Characterization Algorithms
2020 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) conference-paper Computer Science Software Testing and Debugging Techniques

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