January 01, 1992 article Image processing procedures for analysis of electron back scattering patterns Scanning microscopy OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 143 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Superplastic constitutive modeling of TA32 alloy with two-phase characteristics 2025 International Journal of Mechanical Sciences article Engineering Metallurgy and Material Forming Open access 10 citations Comparison of Kikuchi diffraction geometries in the scanning electron microscope 2025 Materials Characterization article Engineering Advanced Materials Characterization Techniques Open access 12 citations Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy 2024 Ultramicroscopy article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 4 citations 3 results References 0